Using this new feature, users can extract resistance and capacitance information of sub-circuits for use in third-party SPICE simulation environments. SEMulator3D Analytics now includes a calibration function, which automates calibration of a virtual model against experimental measurements and target specifications, accelerating the generation of predictive, silicon-accurate process models.Īn all-new rendering engine includes faster loading, interaction, construction and exporting of very large models, along with the ability to generate higher fidelity images, enabling larger models (such as 3D NAND devices) to be built faster and better.

The new version of SEMulator3D 7.0, which is available now, includes many additional features and performance enhancements, including:

SEMulator3D 7.0 Productivity Enhancements This add-on functionality provides insight into how process integration decisions, such as patterning schemes and allowed unit process variations, impact transistor device performance. Transistor performance can be measured across changes in patterning, lithography, etch, deposition, and other process integration effects. Designers can generate transistor IV curves and perform automatic device parameter extraction from those curves. The new Device Analysis capability can extract electrical characteristics of a transistor and explore process variability on device operation, all directly within SEMulator3D. The new Device Analysis capability enables seamless understanding of how process changes, process variability, and integration schemes directly impact transistor device performance.

With added features, performance improvements, and a new Device Analysis capability, SEMulator3D 7.0 addresses both process and device simulation while lowering the barriers to advanced semiconductor technology development. Coventor SEMulator3D 7.0 – the newest version of its semiconductor virtual fabrication platform.

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